Band gap determination in multi-band-gap CuFeO<sub>2</sub> delafossite epitaxial thin film by photoconductivity
The photoconductivity within a wavelength range of 450-1100 nm was determined for a sample of epitaxial delafossite CuFeO2 film grown by pulsed laser deposition. The film thickness was estimated to be 75 nm. The resistance of the films was determined with four-contact van der Pauw's method and...
| Autores principales: | , , , , , , , , |
|---|---|
| Formato: | Artículo (Article) |
| Idioma: | Inglés (English) |
| Publicado: |
2025
|
| Materias: | |
| Acceso en línea: | https://repositorio.uc.cl/handle/11534/100827 |