A hard X-ray view of the soft excess in AGN
An excess of X-ray emission below 1 keV, called soft excess, is detected in a large fraction of Seyfert 1-1.5s. The origin of this feature remains debated, as several models have been suggested to explain it, including warm Comptonization and blurred ionized reflection. In order to constrain the ori...
| Autores principales: | , , |
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| Formato: | Artículo (Article) |
| Idioma: | Inglés (English) |
| Publicado: |
2025
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| Materias: | |
| Acceso en línea: | https://repositorio.uc.cl/handle/11534/101463 |